Statistics
STAT 206 Applied Bayesian Statistics
Introduces Bayesian statistical modeling from a practitioner's perspective. Covers basic concepts (e.g., prior-posterior updating, Bayes factors, conjugacy, hierarchical modeling, shrinkage, etc.), computational tools (Markov chain Monte Carlo, Laplace approximations), and Bayesian inference for some specific models widely used in the literature (linear and generalized linear mixed models). (Formerly AMS 206.)
Instructor
Raquel Prado, Athanasios Kottas, David Draper